TEST (RF, GaAs, GaN, Silicon and Photonics)

Comprehensive test solutions for high-reliability applications

Criteria Labs has the in-house capability to test a wide range of technologies from RF, to high pin count digital parts, complex analog parts, lasers, and photo detectors. We can also test silicon carbide (SiC) and GaN power switching devices. Our in-house test capabilities enable us to provide you with a broad list of testing methods for all types of semiconductors. Our customers can opt for OEM-approved test methods or custom test methods to ensure quality assurance, form, fit, and function.

Test Capabilities

Criteria Labs | Test PhotoTest [LTX-Credence Diamond D10]

Criteria Labs provides test software development, wafer probe, and production test services on LTX Diamond D10 test platforms.  Each test platform is fully configured with (384) 200 Mhz DPIN96 channels, 16 channel VIS16 high voltage VI source, 16 channel DPS16 high current power supplies and 8-channel mixed signal MULTIWAVE instrument providing 4 digitizers and 4 arbitrary waveform generators.

RF Test [Keysight N5245A PNA-X MW Network Analyzer]

RF testing from 10.0 MHz to 50 GHz, PEM’s, space hermetics, hybrid Multi-chip modules (MCM’s), and integrated microwave assemblies (IMA).


Test Software Development

Criteria Labs experienced team of test engineers can support first silicon debug to high volume production for a wide range of device technologies. Our test solutions include; digital, analog, mixed-signal, and memory in both wafer sort and final package part testing.

Wafer Probe

Criteria Labs is the only U.S.-based test services company with the capability to perform all wafer probes in a class 1000 clean room. Wafer cleanliness and prevention of particulate contamination improve probe and package assembly yields. Criteria Labs can support all wafer probe services, including software development, probe card design and fabrication, debug and production probing.

  • All wafer probing is conducted in Class 1000 clean room
  • Cantilever:  1- 100 site probe
  • Vertical: Multi-site probe
  • Room and Hot probing
  • EG 4090 probers
  • Electronic Wafer Mapping
  • Probe Card Design and Development

Final Package Test

Criteria Labs is an industry leader in providing production test services to semiconductor manufacturers, military, aerospace, and OEM’s. We have the systems, processes, and capabilities in place to support a wide array of production test requirements. Whether you have high-volume testing needs or low-volume customized test requirements.

  • Package Test
  • Automated handlers to support all package types
  • Hot and cold manual insertion temperature testing from -65°C to 250°C
  • Custom Test Processing & Flows
  • Temperature testing  (-65°C to 250°C)
  • Serialized data collection
  • Characterization data collection
  • Endurance and data retention testing
  • Device upscreening
  • Upscreening commercial devices to military, industrial or avionics grades
  • Part procurement and upscreening
  • Load board design and development


Markets We Serve

Criteria Labs specializes in RF solutions for a diverse set of markets including defense, commercial semiconductor, space, oil and gas, medical, and automotive companies.

Our Customers

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Our Certifications