Failure Analysis

Criteria labs is a leader in performing Level I root cause failure analysis of electrical and electronic components. From passive components like resistors, inductors and capacitors to transistors, integrated circuits and hybrids and PCB interconnects.

Process Capabilities:

  • External Visual
  • Electrical test / Curve trace
  • Optical Microscopy
  • C-SAM
  • Decapsulation of plastic parts
  • Die deprocessing
  • Die extraction

For more advanced FA requirements Criteria Labs partners with Nanolab Technologies:

  • Advanced Electron Microscopy & Imaging
  • Materials Characterization
  • Surface Chemical Analysis
  • Electrical Failure Analysis
  • Laser Ablation
  • X-ray Imaging
  • Scanning Electron & Energy Dispersive Microscopy
  • De-capsulation and Cross-Sectioning

Please see the Press Release section of our website for more information about the partnership between Criteria Labs and Nanolab Technologies.